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IEEE_SCV-SF_Seminar_TBrozek_Variability_06.13.2017
Apr. 12th, 2016 Learnings and insights from 52 years of Silicon Valley semiconductor experience
Aug 9th, 2016 Circuit Device Interactions and co-optimizations, from system and chip design to process integration – The secret sauce for complex SOC chips and SIPs in advanced technology nodes
August 11th Distinguished lecture on 2D crystals for smart life
August 8th 2017 Recent Progress in Memory Technology Reliability
August 8th, 2017 Recent Progress in Memory Technology Reliability
December 1st, 2016 On-Chip ESD Protection Design: Yesterday, Today, Tomorrow and Future
February 7th, 2017 Buried-Halo MOSFETs for Ultra-Low Power Application at Nano Nodes
February 9th, 2016 Everything You Wish to Know about Memristors But Are Afraid to Ask
IEEE-EDS December Webinar with Dr. Sorin Voginuesco
July 11th, 2017 System Level ESD: A New Focus
July 12th, 2016 Electronics and Energy Applications of 1D and 2D Nanomaterials
July 9th Seminar “Emerging Challenge of Self-heating in Modern FINFET, ETSOI, and Gate-All-Around III-V Transistors”
June 13th, 2017 Device and Process Variability
June 14th, 2016 High Frequency Characterization of Transistors
June 24th, 2015 “A Unified Compact Model for Generic HEMTs”
June 8th, 2015 Seminar- “Recent Progress in Physics and Technology of Oxide Based Resistive Switching Memory”
March 14th, 2017 Progress Toward Wafer-Scale Thermionic Energy Converters
March 8th, 2016 “Technology CAD from Electronics to Bioelectronics”
May 10th, 2016 seminar on Designing with FinFETs
May 19th, 2015 – Nanoscale Vacuum Electronics
May 9th, 2017 New Visions for IC Yield Detractor Detection Bill Nehrer, VP and Account General Manager, PDF Solutions
Mini-colloquium Emerging Devices, Materials and Technologies, Sept 2016
Nov 11th, 2016 Annual Symposium – Device Circuit Interaction in Advanced Technology Nodes
November 10th 2015 seminar “CMOS Image Sensors for True-Color Photography”
November 12, 2021, Seminar on Memristive Neuromorphic Computing Beyond Moore’s Law
October 11th, 2016 Time-Zero and Time-Dependent Variability in Advanced CMOS
October 8th Seminar “Ultra‐thin Chips ‐ a New Paradigm in Silicon Technology”
September 8th Seminar on Tunnel FETs: A Comprehensive Model
The LLNL Quantum Design and Integration Testbed