Past Events

DateTypeSubjectSpeakerPlace 
Thursday, February 8, 2018SeminarBest of RamsBernhard HillerQualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051slides
Thursday, December 1, 2016SeminarReliability and Performance of Carbon Nanotube ViasDr. Cary Y. YangQualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051
Friday, November 11, 2016SeminarDevice Circuit Interaction in Advanced Technology NodesDr. William J. Dally, Dr. Victor Moroz, Dr. John Hu, Dr. Kevin Scoones, and Dr. Suresh RamalingamTexas Instruments, Bldg. E Auditorium, 2900 Semiconductor Drive, Santa Clara, CA, 95051
Thursday, November 3, 2016SeminarCPI stress induced carrier mobility shift in advanced silicon nodesDr. Valeriy Sukharev from Mentor Graphics CorporationQualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051
Thursday, October 6, 2016SeminarReliability and The Self-Driving CarMr. Noah Lassar from GoolgeQualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051
Thursday, September 1, 2016SeminarA Statistical FEA Method for Predicting Glass Fracture in Consumer Electronic ProductsDr. Marc Zampino from Amazon/Lab126Qualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051slides
Thursday, August 4, 2016SeminarSurfaces, Interfaces and Microelectronic PackagingDr. Guna Selvaduray From San Jose State UniveristyQualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051slides
Wednesday, July 13, 2016Seminar,Co-sponsored with The ASQ Silicon Valley Statistics and Reliability Discussion GroupTesla Model S Battery, Charger, and Drive-Unit ReliabilityDr. Larry GeorgeApplied Materials Bowers Cafe (aka Campus Cafe), 3090 Bowers Ave. Santa Clara, CA. 95054
Wednesday, May 11, 2016Seminar,Co-sponsored with The ASQ Silicon Valley Statistics and Reliability Discussion GroupTaking practical steps towards Designing-for-ReliabilityMr. Georgios Sarakakis from TESLA Reliability EngineeringApplied Materials Bowers Cafe (aka Campus Cafe), 3090 Bowers Ave. Santa Clara, CA. 95054
Tuesday, April 12, 2016Seminar, Co-sponsored by IEEE SCV Electronic Devices Society and Reliability SocietyLearnings and insights from 52 years of Silicon Valley semiconductor experienceRay Zinn, Founder and CEO of Micrel, San Jose, CATexas Instruments Building E Conference Center, 2900 Semiconductor Dr., Santa Clara, CA 95052.
Thursday, March 17th, 2016Conference, Co-sponsored by Cisco Systems, Juniper Networks, and OPS Ala Carte5th Annual IEEE International Reliability Innovations ConferenceN/AJuniper Networks , 1194 N Mathilda Ave, Sunnyvale, CA 94089 Building 1, Tuolumne Room
Thursday, March 3, 2016SeminarPhysics based life distribution and reliability modeling of solid state drivesDr. Alexander ParkhomovskyQualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051
Saturday, January 30, 2016One Day Course, co-sponsored by ASME SCV ChapterFracture Mechanics & Fatigue: Theory and Modeling for Mechanical EngineersDr. Metin Ozen, ASME Fellow, Principal, Ozen Engineering Inc, Sunnyvale, CASanta Clara University, 500 El Camino Real, Santa Clara, CA 95053
January 7th, 2016ElectionIEEE SCV REL Society 2016 Officers ElectionN/ALe Boulanger, 305 N Mathilda Ave, Sunnyvale, CA 94086
Dec 3rd, 2015SeminarDesigned to Fail? Exploring Product Reliability Using JMP ProLaura A. Higgins, Ph.D, Sr. Systems Engineer, JMP, SAS InstituteQualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051
Nov 5th, 2015SeminarSoftware Reliability Best PracticesNematollah Bidokhti, Principal Engineer at OCZ Storage SolutionsQualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051
Oct 1st, 2015SeminarEngineering the Right Accelerated Life Tests for Reliability QualificationSudarshan Rangaraj, Ph.D, Amazon Lab126 Reliability ManagerQualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051
Sept 3rd, 2015Seminar, co-sponsored by the ASQ Statistics GroupRethinking Failure Modes and Effects AnalysisJohn Flaig,Ph.D., Fellow of the American Society for QualityQualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051
Aug 12th, 2015Seminar by CPMT, co-sponsoringRobust 3D-IC Package Assembly Process Engineering for High Volume ProductionInderjit Singh, Xilinx Inc.Biltmore Hotel and Suites Santa Clara Hotel - 2151 Laurelwood Road Santa Clara, CA 95054
Aug 6th, 2015SeminarMacroscopic & Stochastic Aspects of Negative Bias Temperature InstabilitySouvik Mahapatra, PhD, Professor of Electrical Engineering, Indian Institute of Tehnology Bombay, Mumbai, IndiaTexas Instruments, 2900 Semiconductor Dr. Santa Clara, CA, 95051
July 7th, 2015SeminarA New Drop Test for BGE Assemblies: Duplicable and EffectiveDongji Xie,NvidiaTexas Instruments,2900 Semiconductor Dr. Santa Clara, CA, 95051
June 4th, 2015SeminarAdhesion and Thermomechanical Reliability for Emerging Device, Energy and Bio-TechnologiesProf. Reinhold H. Dauskardt,Professor of Materials Science & Engineering,Stanford UniversityQualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051
May 7th, 2015SeminarMaking Use of Reliability StatisticsFred Schenkelberg, Consultant, FMS ReliabilityQualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051
Apr 2nd, 2015Seminar, Cosponsored by IEEE SFBA MEMS & Sensors ChapterSurface and Materials Engineering for Enhanced MEMS ReliabilityProf. Roya Maboudian, Dept of Chemical and Biomolecular Engg, UC Berkeley, CAAtmel Corporation, 1600 Technology Drive, San Jose, CA 95110
Mar 5th, 2015Seminar, Cosponsored by IEEE SCVCEReliability of Glass and CoatingsStuart Douglas, Google [X] Reliability EngineerAgilent Technologies, Santa Clara
Feb 5th, 2015Seminar, Cosponsored by IEEE PSES and IEEE VTSTesla Reliability Challenges and OpportunitiesDr. Jiliang Zhang, Tesla MotorsSanta Clara University, Kennedy Commons
Jan 22nd, 2015CPMT Event, Rel co-sponsoredPackaging Driven Reliability in High Voltage Packages.Dr. Luu NguyenTexas Insturments, Inc Texas Instruments, Santa Clara
Jan 15th, 2015Officers MeetingPlanning sessionOfficer MeetingAgilent Technologies, Santa Clara