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Who Killed the PCB? 4/7/22 Link to Presentation
| Date | Type | Subject | Speaker | Place | |
|---|---|---|---|---|---|
| Thursday, February 8, 2018 | Seminar | Best of Rams | Bernhard Hiller | Qualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051 | slides |
| Thursday, December 1, 2016 | Seminar | Reliability and Performance of Carbon Nanotube Vias | Dr. Cary Y. Yang | Qualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051 | |
| Friday, November 11, 2016 | Seminar | Device Circuit Interaction in Advanced Technology Nodes | Dr. William J. Dally, Dr. Victor Moroz, Dr. John Hu, Dr. Kevin Scoones, and Dr. Suresh Ramalingam | Texas Instruments, Bldg. E Auditorium, 2900 Semiconductor Drive, Santa Clara, CA, 95051 | |
| Thursday, November 3, 2016 | Seminar | CPI stress induced carrier mobility shift in advanced silicon nodes | Dr. Valeriy Sukharev from Mentor Graphics Corporation | Qualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051 | |
| Thursday, October 6, 2016 | Seminar | Reliability and The Self-Driving Car | Mr. Noah Lassar from Goolge | Qualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051 | |
| Thursday, September 1, 2016 | Seminar | A Statistical FEA Method for Predicting Glass Fracture in Consumer Electronic Products | Dr. Marc Zampino from Amazon/Lab126 | Qualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051 | slides |
| Thursday, August 4, 2016 | Seminar | Surfaces, Interfaces and Microelectronic Packaging | Dr. Guna Selvaduray From San Jose State Univeristy | Qualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051 | slides |
| Wednesday, July 13, 2016 | Seminar,Co-sponsored with The ASQ Silicon Valley Statistics and Reliability Discussion Group | Tesla Model S Battery, Charger, and Drive-Unit Reliability | Dr. Larry George | Applied Materials Bowers Cafe (aka Campus Cafe), 3090 Bowers Ave. Santa Clara, CA. 95054 | |
| Wednesday, May 11, 2016 | Seminar,Co-sponsored with The ASQ Silicon Valley Statistics and Reliability Discussion Group | Taking practical steps towards Designing-for-Reliability | Mr. Georgios Sarakakis from TESLA Reliability Engineering | Applied Materials Bowers Cafe (aka Campus Cafe), 3090 Bowers Ave. Santa Clara, CA. 95054 | |
| Tuesday, April 12, 2016 | Seminar, Co-sponsored by IEEE SCV Electronic Devices Society and Reliability Society | Learnings and insights from 52 years of Silicon Valley semiconductor experience | Ray Zinn, Founder and CEO of Micrel, San Jose, CA | Texas Instruments Building E Conference Center, 2900 Semiconductor Dr., Santa Clara, CA 95052. | |
| Thursday, March 17th, 2016 | Conference, Co-sponsored by Cisco Systems, Juniper Networks, and OPS Ala Carte | 5th Annual IEEE International Reliability Innovations Conference | N/A | Juniper Networks , 1194 N Mathilda Ave, Sunnyvale, CA 94089 Building 1, Tuolumne Room | |
| Thursday, March 3, 2016 | Seminar | Physics based life distribution and reliability modeling of solid state drives | Dr. Alexander Parkhomovsky | Qualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051 | |
| Saturday, January 30, 2016 | One Day Course, co-sponsored by ASME SCV Chapter | Fracture Mechanics & Fatigue: Theory and Modeling for Mechanical Engineers | Dr. Metin Ozen, ASME Fellow, Principal, Ozen Engineering Inc, Sunnyvale, CA | Santa Clara University, 500 El Camino Real, Santa Clara, CA 95053 | |
| January 7th, 2016 | Election | IEEE SCV REL Society 2016 Officers Election | N/A | Le Boulanger, 305 N Mathilda Ave, Sunnyvale, CA 94086 | |
| Dec 3rd, 2015 | Seminar | Designed to Fail? Exploring Product Reliability Using JMP Pro | Laura A. Higgins, Ph.D, Sr. Systems Engineer, JMP, SAS Institute | Qualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051 | |
| Nov 5th, 2015 | Seminar | Software Reliability Best Practices | Nematollah Bidokhti, Principal Engineer at OCZ Storage Solutions | Qualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051 | |
| Oct 1st, 2015 | Seminar | Engineering the Right Accelerated Life Tests for Reliability Qualification | Sudarshan Rangaraj, Ph.D, Amazon Lab126 Reliability Manager | Qualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051 | |
| Sept 3rd, 2015 | Seminar, co-sponsored by the ASQ Statistics Group | Rethinking Failure Modes and Effects Analysis | John Flaig,Ph.D., Fellow of the American Society for Quality | Qualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051 | |
| Aug 12th, 2015 | Seminar by CPMT, co-sponsoring | Robust 3D-IC Package Assembly Process Engineering for High Volume Production | Inderjit Singh, Xilinx Inc. | Biltmore Hotel and Suites Santa Clara Hotel - 2151 Laurelwood Road Santa Clara, CA 95054 | |
| Aug 6th, 2015 | Seminar | Macroscopic & Stochastic Aspects of Negative Bias Temperature Instability | Souvik Mahapatra, PhD, Professor of Electrical Engineering, Indian Institute of Tehnology Bombay, Mumbai, India | Texas Instruments, 2900 Semiconductor Dr. Santa Clara, CA, 95051 | |
| July 7th, 2015 | Seminar | A New Drop Test for BGE Assemblies: Duplicable and Effective | Dongji Xie,Nvidia | Texas Instruments,2900 Semiconductor Dr. Santa Clara, CA, 95051 | |
| June 4th, 2015 | Seminar | Adhesion and Thermomechanical Reliability for Emerging Device, Energy and Bio-Technologies | Prof. Reinhold H. Dauskardt,Professor of Materials Science & Engineering,Stanford University | Qualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051 | |
| May 7th, 2015 | Seminar | Making Use of Reliability Statistics | Fred Schenkelberg, Consultant, FMS Reliability | Qualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051 | |
| Apr 2nd, 2015 | Seminar, Cosponsored by IEEE SFBA MEMS & Sensors Chapter | Surface and Materials Engineering for Enhanced MEMS Reliability | Prof. Roya Maboudian, Dept of Chemical and Biomolecular Engg, UC Berkeley, CA | Atmel Corporation, 1600 Technology Drive, San Jose, CA 95110 | |
| Mar 5th, 2015 | Seminar, Cosponsored by IEEE SCVCE | Reliability of Glass and Coatings | Stuart Douglas, Google [X] Reliability Engineer | Agilent Technologies, Santa Clara | |
| Feb 5th, 2015 | Seminar, Cosponsored by IEEE PSES and IEEE VTS | Tesla Reliability Challenges and Opportunities | Dr. Jiliang Zhang, Tesla Motors | Santa Clara University, Kennedy Commons | |
| Jan 22nd, 2015 | CPMT Event, Rel co-sponsored | Packaging Driven Reliability in High Voltage Packages. | Dr. Luu Nguyen | Texas Insturments, Inc Texas Instruments, Santa Clara | |
| Jan 15th, 2015 | Officers Meeting | Planning session | Officer Meeting | Agilent Technologies, Santa Clara |
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