Fen Chen, Staff Reliability/Validation Engineer, GM Cruise

Reliability Engineering Testing Methodology and Statistical Knowledge for Qualifications of Consumer Products and Automotive Components –

Fen Chen, Staff Reliability/Validation Engineer, GM Cruise

Thursday 09/17/2020 @ 12 pm – 1 pm

Online Event – Google Meet – Link to be provided upon registering

Abstract:

Consumer electronic devices and today’s fast-growing automotive industry continue to demand ever-higher product and component reliability. During this second part of the tutorial, some important statistic concepts including the common continuous probabilistic models, impact of choice of statistical model on lifetime projection, specialties of Weibull statistics, area scaling and Poisson statistics, clustering distribution model for an imperfect system, and 10 most popularly used equations for Rel engineering practices will be discussed first.

Then the tutorial will focus on physics of failure (PoF) based acceleration life models for some common Rel testing failures. A deep dive discussion on temperature cycling model considering dT acceleration, dwell time acceleration, ramp rate acceleration, and Tmax acceleration, especially the conflicting effects between ramp time and dwell time will be explored. An example of using rainflow counting analysis on product mission profile together with the modified Lorris-Landzberg equation to determine a realistic cumulative failure rate of a TC failure mechanism will be given.

Next, a typical methodology to develop a PoF based Rel validation testing plan will be introduced. Finally, some risk assessment and lifetime prediction examples including time-dependent parametric shift modeling and 2D stress-strength failure rate determination for vastly distributed usage conditions will be presented.

Bio:

Fen Chen received his Ph.D. degree in Electrical Engineering in 1998 from University of Delaware. From 1997 to 1998, he was with Intel Component Research at Santa Clara, CA as a graduate intern working on IC interconnect reliability. He joined IBM microelectronics at Essex Junction, VT in 1998 and had worked on semiconductor technology reliability issues until 2015.

From 2015 to 2019, he worked for Apple Inc at Cupertino, CA as a senior reliability engineer focusing on qualifications of various consumer electronic products. In 2019, he joined Lumileds at San Jose, CA as the director of quality and reliability and was responsible for qualifying novel uLED MCM products for automotive applications.

After 6-month of work at Lumileds, he joined GM Cruise in 2019 as a staff reliability /validation engineer, and has been working on validations of electronic, optical and electromechanical modules for groundbreaking Cruise AV hardware systems since then. He holds more than 55 patents and has published over 60 technical papers/invited talks on various journals and conference proceedings.

IEEE SCV REL sponsored by EAG

Attendance to this seminar will count towards professional development hours for IEEE, ASQ. Please feel free to forward this message to your friends and colleagues.

Agenda:

11:55 AM: Meeting will open

12:00 PM – 12:50 PM: Presentation

12:50 PM – 1:00 PM: Q&A

Meeting Link: Google Meet – Link to be provided upon registering