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A realistic and useful ESD test for consumer electronics (Reliability Chapter event co-sponsored by CE Society)

Name: A realistic and useful ESD test for consumer electronics (Reliability Chapter event co-sponsored by CE Society)
Start: 2017-08-03T18:00:00-07:00
End: 2017-08-03T20:30:00-07:00
Location: Qualcomm

August 3, 2017 @ 6:00 pm - 8:30 pm

Details

Date:: August 3, 2017
Time:: 6:00 pm - 8:30 pm
Website:: http://ewh.ieee.org/r6/scv/rl/events.html

Organizer

: IEEE Reliability Society
: View Organizer Website

Venue

: Qualcomm
: 3165 Kifer Road
Santa Clara, CA 95054 United States + Google Map

IEEE SFBA Consumer Technology Chapter

A realistic and useful ESD test for consumer electronics (Reliability Chapter event co-sponsored by CE Society)

August 3, 2017 @ 6:00 pm - 8:30 pm

Details

Organizer

Venue