Latest Past Events

IEEE PCJS SSCS DL by Dr Farhana Sheikh : FPGA-Chiplet Architectures and Circuits for 2.5D/3D 6G Intelligent Radios

Virtual: https://events.vtools.ieee.org/m/420965

The number of connected devices is expected to reach 500 billion by 2030, which is 59-times larger than the expected world population. Objects will become the dominant users of next-generation communications and sensing at untethered, wireline-like broadband performance, bandwidths, and throughputs. This sub-terahertz 6G communication and sensing will integrate security and intelligence. It will enable a 10x to 100x increase in peak data rates. FPGAs are well positioned to enable intelligent radios for 6G when coupled with high-performance chiplets incorporating RF circuits, data converters, and digital baseband circuits incorporating machine learning and security. This talk presents use of 2.5D and 3D heterogeneous integration of FPGAs with chiplets, leveraging Intel’s EMIB/Foveros technologies with focus on one emerging application driver: FPGA-based 6G sub-THz intelligent wireless systems. Nano-, micro-, and macro-3D heterogeneous integration is summarized, and previous research in 2.5D chiplet integration with FPGAs is leveraged to forge a path towards new 3D-FPGA based 6G platforms. Challenges in antenna, packaging, power delivery, system architecture design, thermals, and integrated design methodologies/tools are briefly outlined. Opportunities to standardize die-to-die interfaces for modular integration of internal and external circuit IPs are also discussed. Speaker(s): Dr Farhana Sheikh, Agenda: 8pm - 9pm EST : DL and Q/A Virtual: https://events.vtools.ieee.org/m/420965

Evolution of Microprocessor Circuit Design and Future Challenges: A Career Perspective

Bldg: MIT Building 34, Grier Room A ( 34-401A), Cambridge, Massachusetts, United States, Virtual: https://events.vtools.ieee.org/m/436957

The relentless pace of Moore’s law has enabled rapid evolution of microprocessors performance with resulting dramatic increases in complexity. This talk will review some microprocessor design history and reflect on the speaker’s 40+ years of work in the semiconductor industry. Circuit innovation has been an important contributor delivering performance. However, the overriding requirement has been to deliver ever more complex high-quality designs on schedule to intercept the latest technology node. The goal of this talk will be to provide practical insights of value today and the future for engineers entering the field. Speaker(s): Bill Bowhill, Agenda: Presentation by Bill Bowhill: 12:00-1:00 PM Lunch and Reception: 1:00-2:30 PM Bldg: MIT Building 34, Grier Room A ( 34-401A), Cambridge, Massachusetts, United States, Virtual: https://events.vtools.ieee.org/m/436957

IEEE PCJS DL “Continuum Robots” by Prof. Dr. Burgner-Kahrs

Virtual: https://events.vtools.ieee.org/m/418861

IEEE PCJS DL “Continuum Robots” by Prof. Dr. Burgner-Kahrs Thursday, September 19, 2024 6:45 PM | (UTC-04:00) Eastern Time (US & Canada) | 2 hrs (https://ieeemeetings.webex.com/ieeemeetings/j.php?MTID=m03cb0fad1bd1503b31762868a9340315) https://ieeemeetings.webex.com/ieeemeetings/j.php?MTID=m03cb0fad1bd1503b31762868a9340315 Meeting number: 2533 281 0850 Meeting password: 3ZRmzc Join from a video system or application Dial [email protected] You can also dial 173.243.2.68 and enter your meeting number. To dial from an IEEE Video Conference System: *1 2533 281 0850 Tap to join from a mobile device (attendees only) (tel:%2B1-415-655-0002,,*01*25332810850%23%23*01*) United States Toll (tel:1-855-282-6330,,*01*25332810850%23%23*01*) United States Toll Free Join by phone +1-415-655-0002 United States Toll 1-855-282-6330 United States Toll Free (https://ieeemeetings.webex.com/ieeemeetings/globalcallin.php?MTID=m2b8c7317161b7fa799935c3e92c41e57) | (https://cisco.com/go/tollfree-restrictions) (https://ieeemeetings.webex.com/ieeemeetings/j.php?MTID=mcff53e0218e53a1b3443447b741a56f7) to your calendar. (Cannot add from mobile devices.) Speaker(s): Prof. Dr. Burgner-Kahrs, Virtual: https://events.vtools.ieee.org/m/418861