reliability
IEEE Technical Talk – IC & MEMS Packaging: Simulating Manufacturability, Reliability, and Performance
“IC & MEMS Packaging: Simulating Manufacturability, Reliability, and Performance” by Mr Steve Groothuis, Senior Member Technical Staff, Micron Technology, Inc., USA. Date: May 28, 2013 (Tuesday) Time: 7:00 pm –… Read more
IEEE Technical Talk – Process Integration and Reliability for Copper Interconnects in Low-k Dielectrics
“Process Integration and Reliability for Copper Interconnects in Low-k Dielectrics” by Jeffrey Gambino, PhD, IBM Microelectronics, Essex Junction, Vermont, USA. Date: August 25, 2011 (Thursday) Time: 7:00 pm – 9:00… Read more