reliability
IEEE-IEM eETD Mini Colloquium
Organizer: IEEE Malaysia ED/MTT/SSC Penang Joint Chapter Co-organizer: Electronic Engineering Technical Division (eETD), The Institution of Engineers Malaysia Date: September 24, 2016 (Saturday) Venue: PSDC, 1 Jalan Sultan Azlan Shah,… Read more
IEEE Distinguished Lecture – A Review Pertinent to Next Generation RRAM (Resistive Random Access Memory) Reliability
“A Review Pertinent to Next Generation RRAM (Resistive Random Access Memory) Reliability” by Professor Chao Sung LAI, Dean of Institute of Engineering, Chang Gung University, Taiwan. IEEE Distinguished Lecturer. June… Read more