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IEEE-IEM eETD Mini Colloquium

Posted on September 12, 2016 by IEEE Penang

Organizer: IEEE Malaysia ED/MTT/SSC Penang Joint Chapter Co-organizer: Electronic Engineering Technical Division (eETD), The Institution of Engineers Malaysia Date: September 24, 2016 (Saturday) Venue: PSDC, 1 Jalan Sultan Azlan Shah,… Read more →

Tagged 3d, applications, Circuits, embedded, finding, flash, image, MCU, memory, mems, packaging, range, reliability, sensors, smart, SOC, systems, technology

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