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IEEE Distinguished Lecture – A Review Pertinent to Next Generation RRAM (Resistive Random Access Memory) Reliability
“A Review Pertinent to Next Generation RRAM (Resistive Random Access Memory) Reliability” by Professor Chao Sung LAI, Dean of Institute of Engineering, Chang Gung University, Taiwan. IEEE Distinguished Lecturer. June… Read more
IEEE Technical Talk – Next-Generation Mobile Broadband: LTE-Advanced
“Next-Generation Mobile Broadband: LTE-Advanced” by Assistant Professor Anthony Lo, Faculty of Electrical Engineering, Mathematics and Computer Science, Delft University of Technology, The Netherlands. Date: October 18, 2011 (Tuesday) Time: 7.00pm… Read more