• IEEE.org
  • IEEE Xplore Digital Library
  • IEEE Standards
  • IEEE Spectrum
  • More Sites
IEEE logo

IEEE Penang Joint Chapter

IEEE Malaysia ED/MTT/SSC

Skip to content
  • Home
  • Events & Meetings
  • About
  • Communities
  • Leadership
  1. Home

memory

IEEE-IEM eETD Mini Colloquium

Posted on September 12, 2016 by IEEE Penang

Organizer: IEEE Malaysia ED/MTT/SSC Penang Joint Chapter Co-organizer: Electronic Engineering Technical Division (eETD), The Institution of Engineers Malaysia Date: September 24, 2016 (Saturday) Venue: PSDC, 1 Jalan Sultan Azlan Shah,… Read more →

Tagged 3d, applications, Circuits, embedded, finding, flash, image, MCU, memory, mems, packaging, range, reliability, sensors, smart, SOC, systems, technology

IEEE Distinguished Lecture – A Review Pertinent to Next Generation RRAM (Resistive Random Access Memory) Reliability

Posted on June 6, 2015 by IEEE Penang

“A Review Pertinent to Next Generation RRAM (Resistive Random Access Memory) Reliability” by Professor Chao Sung LAI, Dean of Institute of Engineering, Chang Gung University, Taiwan. IEEE Distinguished Lecturer. June… Read more →

Tagged access, generation, memory, next, pertinent, random, reliability, resistive, review, rram

  • Home
  • Contact & Support
  • Accessibility
  • Nondiscrimination Policy
  • IEEE Ethics Reporting
  • IEEE Privacy Policy
  • Terms

IEEE Penang Joint Chapter
IEEE Malaysia ED/MTT/SSC
© Copyright 2025 IEEE – All rights reserved. A public charity, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity.

IEEE