generation
IEEE Distinguished Lecture – A Review Pertinent to Next Generation RRAM (Resistive Random Access Memory) Reliability
“A Review Pertinent to Next Generation RRAM (Resistive Random Access Memory) Reliability” by Professor Chao Sung LAI, Dean of Institute of Engineering, Chang Gung University, Taiwan. IEEE Distinguished Lecturer. June… Read more
IEEE Distinguished Lecture – Evolution of Si CMOS Technologies to Sub-10 nm Generation
“Evolution of Si CMOS Technologies to Sub-10 nm Generation” by Professor Hiroshi Iwai, Tokyo Institute of Technology, Japan. IEEE Distinguished Lecturer. Date: November 30, 2012 (Friday) Time: 2:30 pm –… Read more