Month: May 2021
“Designing digital modules for high-speed read-out in cryogenic TPC detectors” by Dr. Aseem Gupta
“Designing digital modules for high-speed read-out in cryogenic TPC detectors” Aseem Gupta, SLAC, Instrument Division, Stanford University Event Organized By: Circuits and Systems Society (CASS) of the IEEE Santa Clara Valley Section PROGRAM:… Read more
Fault Tolerant Smart Power Drivers with Biasing Schemes and Diagnostics for Smart Automotive Systems
Dr. –Ing Sri Navaneeth Easwaran, Texas Instruments Event Organized By: Circuits and Systems Society (CASS) of the IEEE Santa Clara Valley Section Registration Link: here PROGRAM: 6:55 – 7:00 PM Intro 7:00 – 7:50… Read more