SF Bay Area Nanotechnology Council

IEEE

Oct 15th, 2019: Industrial Applications of EBSD (Electron backscatter diffraction) and ECCI (Electron channeling contrast imaging)

Industrial Applications of EBSD (Electron backscatter diffraction) and ECCI (Electron channeling contrast imaging)

Dr. Jingyi Zhang, EBSD Scientist at EAG Laboratories

Register: Here

Tues Oct 15
11:30am: Networking & Pizza
Noon-1PM: Seminar
Cost: $4 to $6
Location: EAG Laboratories – 810 Kifer Road, Sunnyvale


Electron backscattered diffraction (EBSD) is a rapidly developing technique in the material characterization field. The technique gives microstructure information in the meso-scale which includes grain size, crystal orientation, grain boundaries, dislocations, and phase identification that all contribute to the device performance and reliability. Typical components that benefit from the EBSD analysis includes bond pads, solder joints, thin wires and capacitors. Electron channeling contrast imaging (ECCI) is a derivative technique from EBSD that gives quantitively defect density measurement of single crystals. The scanning area is on the order of several tens to hundreds of micrometers making this measurement ideal for high quality crystals (defect density 108/cm2 to 105/cm2).

       
Dr. Jingyi Zhang 
is an EBSD Scientist at EAG Laboratories, which she joined in 2018 after completing a doctorate in Mechanical Engineering at Washington State University. Her thesis was on mechanical and microstructural characterization of friction welds of dissimilar aluminum alloys. Previously she had earned an MS in Materials Science and Engineering at Iowa State University, and a BS in Materials Science at Tianjin University.

Comments are closed.