Day: May 13, 2021
Fault Tolerant Smart Power Drivers with Biasing Schemes and Diagnostics for Smart Automotive Systems
Dr. –Ing Sri Navaneeth Easwaran, Texas Instruments Event Organized By: Circuits and Systems Society (CASS) of the IEEE Santa Clara Valley Section Registration Link: here PROGRAM: 6:55 – 7:00 PM Intro 7:00 – 7:50… Read more