The Test Feeder Working Group recently published a paper describing the group’s progress and intended uses for each of the distribution test circuits.
P. Schneider, B. A. Mather, B. C. Pal, C. W. Ten, G. J. Shirek, H. Zhu, J. C. Fuller, J. L. R. Pereira, L. F. Ochoa, L. R. de Araujo, R. C. Dugan, S. […]

The next DAS meeting will be held at the 2018 IEEE PES GM in Portland, OR on August 5-10.  Specific times and date to come.