The Test Feeder Working Group recently published a paper describing the group’s progress and intended uses for each of the distribution test circuits.
P. Schneider, B. A. Mather, B. C. Pal, C. W. Ten, G. J. Shirek, H. Zhu, J. C. Fuller, J. L. R. Pereira, L. F. Ochoa, L. R. de Araujo, R. C. Dugan, S. […]