The Test Feeder Working Group recently published a paper describing the group’s progress and intended uses for each of the distribution test circuits.
P. Schneider, B. A. Mather, B. C. Pal, C. W. Ten, G. J. Shirek, H. Zhu, J. C. Fuller, J. L. R. Pereira, L. F. Ochoa, L. R. de Araujo, R. C. Dugan, S. Matthias, S. Paudyal, T. E. McDermott, and W. Kersting, “Analytic Considerations and Design Basis for the IEEE Distribution Test Feeders,” IEEE Transactions on Power Systems, vol. PP, no. 99, pp. 1-1, 2017.