EMC Society – Orange County Chapter

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IEEE Los Angeles and Orange County EMC Chapter and Los Angeles MTT/AP Chapter Meeting Announcement

Tuesday, January 22nd, 2019


Improving the Understanding and Efficiency of EMC, RF, Microwave and Antenna Measurements


This is a free workshop open to IEEE members and guests, but you must register IN ADVANCE

no later than Thursday, February 7 to ensure adequate seating and catering


Date:                 Monday, February 11, 2019


Time:               12:00 pm – 1:00 pm           Registration and Complimentary Lunch


1:00 pm – 4:00 pm           Presentations and Live Demonstration, including a break between speakers – Note the expert speakers are traveling to California specifically for this workshop!


4:00 pm – 5:00 pm           Social time with speakers; no host beer


Location:         Common Space Brewery, 3411 West El Segundo Blvd., Hawthorne, CA


Register:          Click here to register on line.   SPACE IS LIMITED – RESERVE EARLY TO SAVE YOUR SPACE!!!


Contact:           IEEE EMC Chapter Vice-Chair Janet O’Neil, ETS-Lindgren, cell 425-443-8106, email j.n.oneil@ieee.org




Complimentary seminar hosted by Element Materials Technology and the Orange County EMC Chapter

Wednesday, March 15th, 2017

Get the Latest on RED and CE Marking Directives + an Update on 60601-1-2 4th ed.

Join Element and your local OC EMC Chapter for a complimentary half-day seminar!

Seminar will address:

  • Major changes with the Radio Equipment Directive (RED)
  • CE Marking Directives
  • An update on 60601-1-2 4th edition

​We will also provide an introduction to our latest service offering, Product Safety testing.

With the imminent deadline for RED fast approaching, this seminar will cover the most important legislative changes in Radio, CE Marking and Safety testing, discussing best approaches to compliance.

The seminar will feature Element’s engaged experts from Element UK, and Greg Kiemel from Element US.

For more information and to register for this event, please click on the following link:



IEEE Los Angeles and Orange County EMC Chapters and Los Angeles MTT/AP Chapter Meeting Announcement

Tuesday, August 30th, 2016

Recent Developments in EMC Design and Test for
Improved Measurements and Performance Evaluation

This is a free seminar, but you must register IN ADVANCE
no later than Friday, September 9 to ensure adequate seating and catering. The Toyota Automotive Museum exhibits are also available for viewing at no charge to IEEE seminar attendees.

Date: Tuesday, September 13, 2016

Time: 3:00 pm – 3:30 pm Registration
3:30 pm – 6:15 pm Presentations, including a break between speakers
6:15 pm – 7:00 pm Refreshments with speakers; tour of museum exhibits

Location: The Toyota Automotive Museum, 19600 Van Ness Ave., Torrance, CA 90501
Museum Phone: 310-468-8726, Website: www.toyotausamuseum.com
See map for directions. There is plenty of free parking near the entrance to the museum.

RSVP: Contact Eric Hahn with Altamont Technical Services at (858) 472-7666 or email eric@atsemc.com for more information and to RSVP. You can also reserve on line – SEE LINK BELOW. SPACE IS LIMITED – RESERVE EARLY TO SAVE YOUR SPACE!!!


Please click here for details on speakers and more information. More Information

Sharing IEEE San Diego Section Meeting Details

Friday, May 29th, 2015

Tuesday June 2nd, 2015, 6pm-8pm

IEEE San Diego Section Talk

Using an Automated Near-Field Solution to Approximate Resonant Far Field Values

Dinner Date/Time:  Tuesday June 2nd, 2015, from 6 – 8pm PST


Traditional methods for establishing EMC and field density can be predicted using a field approximation routine based on well documented principles. In the process of reducing spurious emissions or interference EMC engineers will use suppression techniques of shields, boxes and cages. These methods have been found to work in normal applications but as the frequency expands traditional methods of EMC suppression may not be as effective. Key to timely development of product is to be able to establish what fields may cause signal integrity problems or resonances which will impact certification, being able to determine evanescent or resonant modes can reduce demand on far field chambers and expedite problem solving at the bench. The far field approximation technique presented allows an engineer to test a sub assembly in the near field and then have a value which can be extrapolated to the far field. Measurements taken using the broadband near field “magnetic probe method” used with an automated scanning system (EM-ISight) can be extrapolated to either a 3m or 10m range space. Such a technique can allow the design engineer to determine the effectiveness of their design prior to the final integration of an assembly thus understanding better the uncertainties of a previously developed reference design or suppression methods. 
Stuart Nicol, Aprel (CEO)

Stuart Nicol has worked within the field of high technology/telecommunications for over 16 years both in Europe and North America. He has been the lead in all major automated system development programs at APREL including SAR (Specific Absorption Rate). HAC (Hearing Aid Compatibility) and EM-ISight (near field scanning). He has held many positions within the international standards development committees and is the current chairman for the Canadian delegation of IEC TC-106, he received his degree in the United Kingdom (electronic and manufacturing engineering) and is the CEO of APREL

Jesse Hones,

Jesse Hones, is the Senior Design Engineer and Team Leader for the EM-ISight System and the Team Leader for Far Field Approximation module in the EM-ISight Near Field scanning system.  He is the Manager of Engineering Systems at APREL. In 2014, he was a keynote speaker at the International Standards Laboratory (ISL) Automotive Seminar in Taiwan.  He has earned an Honors Bachelor of Science in Engineering Degree, Engineering Systems and Computing, from the University of Guelph, 2005, and a Computer and Information Science Minor Degree, from the University of Guelph.  He is a member of the IEEE organization, and a member of the Professional Engineers of Ontario, Canada.


Advanced Test Equipment Corp, Training Center
10401 Roselle St. San Diego, CA 92121


    Start @ 6:00pm
  – 30 min Social Dinner & Networking
  – 10 min Intro & housekeeping
  – 60-90 min feature presentation/topic
  – 5 min wrap-up

This meeting is free to attend and dinner is provided.


Seating is limited to 45 attendees, please RSVP using the link below:

Questions:  see galcala@atecorp.com

Medical/Wireless Seminar

Thursday, December 11th, 2014

The Orange County EMC Chapter is hosting a joint event with Northwest EMC’s Irvine. California facility to present a Medical & Wireless Seminar.

Space is limited. Please RSVP with Alee Langford (alangford@nwemc.com) or 503-943-3122. Please also contact Alee Langford with any questions. 

Date: Wednesday, 1/21/2015

Time: 12:00pm-5:00pm


Northwest EMC Inc. Irvine Facility
41 Tesla
Irvine, CA 92618





Introduction to Medical EMC & IEC 60601-1-2 – 4th Edition

Thursday, June 26th, 2014
In a joint meeting with the local PSES chapter, the following presentation will given:
Date: Tuesday, July 22, 2014
Time: 5:30pm
Northwest EMC Inc. – Irvine, CA
41 Tesla
Irvine, CA 92618
Please RSVP to bayhic@aol.com (RSVPs must be received by 5pm 7/21/2014)
This presentation touches on the challenges dealing with EMC compliance on medical electrical equipment. In addition, the fourth edition of IEC 60601-1-2 has just been published, and this means dramatic changes for the medical electronics industry.
The presentation will address the following;
•             Relationship of IEC 60601-1-2 with Other Standards
•             Motivation & Philosophy of the 4th Edition
•             What is “Essential Performance” and “Basic Safety”?
•             Comparison of 3rd and 4th Edition Requirements
•             In Depth Review of IEC 60601-1-2, 4th Edition
•             “Intended Use” vs. “Normal Use”
•             ESD Testing on Connectors
•             Labeling & Documentation Requirements
•             When Do We Have to Comply with the 4th Edition?
•             New Standard: IEC 60601-4-2 for EMC “Performance”
Speaker Bio:
Darryl Ray is the founder and Principal Consultant for Darryl Ray EMC Consulting.  He has more than 35 years EMC experience working in the medical device, ITE and defense industries. Darryl has performed EMC engineering duties on over 100 products. Mr. Ray received a Bachelors of Engineering Technology degree from Wayne State University in Detroit, Michigan.  He is an iNarte Certified Master EMC Design Engineer. Darryl is a Senior Member of the IEEE, former chair of the IEEE Santa Clara Valley EMC chapter and has authored several papers for past IEEE EMC symposiums. He has designed and supervised the construction of 8 EMC labs including numerous anechoic chambers.  Mr. Ray is an active member of IEC TC62A/Maintenance Team 23 pertaining to the development of IEC 60601-1-2 and also a member of the US national committees for CISPR 11, 22, 24, 32 and 35. 

IEEE “Future of Wireless” panel

Tuesday, January 7th, 2014

IEEE “Future of Wireless” panel in Newport Beach, CA on Sunday, January 19, 2014.

Expert speakers on wireless, including Dr. G. P. Li from UC Irvine on the panel, as well as Prof Yahya Rahmat-Samii from UCLA and John Walley from Broadcom.

This wireless panel on Jan 19 is free to attend and open to all IEEE members and guests.  Details are attached. Meeting Announcement – RWW2014 Future of Wireless Panel

NOTE:  This is the kickoff event for the IEEE Radio Wireless Week that will be held on Jan 19-21 at the Marriott Newport Beach Hotel.