Department of Electrical & Computer Engineering
Florida International University
College of Engineering & Computing

In Conjunction with the
Institute of Electrical and Electronics Engineers, Inc.
Industry Applications Society

LLG micromagnetic analysis of perpendicular recording heads
-Future recording write and read heads-

Professor Yasushi KANAI, Dr. Eng.
Department of Information and Electronics Engineering
Niigata Institute of Technology, Japan

Date: March 26, 2012
Time: 2:30 PM
Place: ECE Department, FIU
10555 W. Flagler Street, Miami, Florida
ECE Conference Room (EC 3753)

Abstract:

In the first half, planar type recording write heads were investigated using a micromagnetic analysis targeting a transfer-rate of 5 GHz. Six different planar head structures with various yoke widths, yoke heights, and coil locations were modeled. Six different conventional single-pole type (SPT) write heads were also used for comparison. It was found that the planar heads had a faster high-frequency response, a larger recording field, and a smaller ATE field. In the planar head, the most dominant factor for high transfer-rate recording was the coil location relative to the main pole tip and the return yoke height, while the yoke width was less important. Because the multi-turn coil can be realized with a wide yoke, it is advantageous in the planar head.

In the second half, micromagnetic analysis of tunneling magnetoresistive (TMR) heads were carried out to investigate the thermal noise and the spin-transfer-torque noise. The calculated results showed the phenomena peculiar to the spin-transfer-torque noise. The calculated critical current density was in agreement with the measured one. As a future read head, scissors type, dual free-layered read head, was also investigated targeting an areal density of 4 terabit/inch².

For Seat Reservation Contact: Mr. Siva (svall030@fiu.edu)
For Lecture Information Contact Dr. O. A. Mohammed (o.mohammed@ieee.org) Tel: 305-348-3040.
Refreshments will be served.